Updated: March 24, 2000
NANOVAN PRODUCT INFORMATION
[NanoVan product page]
||Colorless or pale yellow solution
||1.2 (March 2000)
Technical Assistance Online
Material Safety Data Sheet (PDF)
NANOVAN is a negative stain for electron microscopy specially tailored for use with NANOGOLD antibody conjugates, not available elsewhere. It is based on vanadium, which has a lower atomic number (23) than other elements commonly used as negative stain reagents such as uranium (92), tungsten (74) or lead (82). NANOVAN is recommended for visualization of all samples labeled with NANOGOLD, and may be used in other applications where a relatively light stain is required.1, 2, 3 It produces a light, uniform negative stain. NANOVAN is stable, non-volatile in the beam and will not denature protein samples.
See our 1994 MSA paper about NanoVan.
NANOVAN is supplied ready-to-use, as a 2 % solution in water at pH 8.0. It is recommended that this product not be used at pH values lower than 7 since precipitation may occur.
NANOVAN should be refrigerated upon receipt, and stored at 2 - 8°C.
Instructions for Use
NANOGOLD labeling, washing and postfixing (if required) should be completed as directed in the instructions supplied with the appropriate product, and the specimen rinsed thoroughly with deionized water. NANOVAN is supplied ready-to-use as a 2 % solution in water at pH 8.0. Apply a few drops, sufficient to wet the specimen completely, then wick to remove the excess and observe as usual.
For an introduction to the technique of negative staining and images of negatively stained virus particles, visit Linda Stannard's Virus ultrastructure WWW pages (University of Cape Town).
- Tracz, E., Dickson, D. W., Hainfeld, J. F., and Ksiezak-Reding, H. Paired helical filaments in corticobasal degeneration: the fine fibrillary structure with NanoVan. Brain Res., 773, 33-44 (1997).
- Gregori, L., Hainfeld, J. F., Simon, M. N., and Goldgaber, D. Binding of amyloid beta protein to the 20S proteasome. J. Biol. Chem., 272, 58-62 (1997).
- Hainfeld, J. F.; Safer, D.; Wall, J. S.; Simon, M. N.; Lin, B. J., and Powell, R. D.; Proc. 52nd Ann. Mtg., Micros. Soc. Amer.; G. W. Bailey and Garratt-Reed, A. J., (Eds.); San Francisco Press, San Francisco, CA, 1994, p. 132.
See the complete paper
- Tracz, E.; Dickson, D. W.; Hainfeld, J. F., and Ksiezak-Reding, H.; Proc. XIIIth Int. Cong. for Electr. Micros., Paris, 1994, pp. 675-676.